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    • 產品展示首頁 > 產品中心 > 德國Fischer菲希爾 > Fischer測厚儀 > Fischer測厚儀FD10集合雙功能
      Fischer測厚儀FD10集合雙功能

      Fischer測厚儀FD10集合雙功能

      更新時間:2024-09-23
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      Fischer測厚儀FD10集合雙功能:挑選合適的探頭和探頭本身的質量等。Helmut Fischer為您提供種類多樣、品質的高精度探頭,所有探頭都是按照Z高的品質要求自行研發和制造。

      Fischer測厚儀FD10集合雙功能的詳細資料:

      品牌Helmut Fischer/德國菲希爾

      菲希爾便攜式涂層測厚儀探頭FD10

       

      Fischer測厚儀FD10集合雙功能:挑選合適的探頭和探頭本身的質量等。Helmut Fischer為您提供種類多樣、品質的高精度探頭,所有探頭都是按照zui高的品質要求自行研發和制造。

      The rugged  FMP 20series uses the eddy current method according to DIN EN ISO 2360, ASTM B244. It measures:

      Paint, lacquer or plastic coatings on non-ferromagnetic metal substrate materials; used for anodic coatings on aluminum

      as well as electrically anodic coatings on aluminum and electrically conducting coatings on non conducting carrier materials.

      A special application is the measurement of thin chromium coatings on copper.

      For further product information, please click on the header of the relevant product within the technical spreadsheet below.

      The  as a part of the new FMP20 series is even more versatile than the standard models. These instruments integrate additional features such as more memory for up to 100 applications as well as extensive statistical and graphical evaluations. Tolerance limits can be entered into the calibratable applications and the production process can be analyzed statistically. The default mode can be switched to matrix mode for connected multipoint measurements. These are only a few of the many features described below.

      德國Fischer新款涂層測厚儀產品系列

      DELTASCOPE FMP10 為磁性涂層測厚儀,訂貨號:604-301
      ISOSCOPE FMP10為渦流涂層測厚儀,訂貨號:604-298
      DUALSCOPE FMP20為磁性/渦流涂層測厚儀,訂貨號:604-285
      DELTASCOPE FMP30為磁性涂層測厚儀,訂貨號:604-297
      ISOSCOPE FMP30為渦流涂層測厚儀,訂貨號:604-299
      DUALSCOPE FMP40為磁性/渦流雙功能涂層測厚儀,訂貨號:604-286

       

      ISOSCOPE  FMP30

      ISOSCOPE  FMP10

      ISOSCOPE  MP0 USB

      Probes

      plug-in type

      plug-in type

      integrated

      Applications

      100

      1

      1

      Statistics

      Extensive evaluation,
      e.g. process tolerance limits
      and graphical evaluation

      Common values,
      e.g. mean value and standard deviation

      Common values,
      e.g. mean value and standard deviation

       

       


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